Materials Metrology in Nanotechnology
【Speaker】Robert D. ShullIN【Affiliation】National Instituteof Standards and Technology ,Gaithersburg, Maryland, USA.
【Time】
【Venue】
【Abstract】
【Fulltext】[url]http://www.box.net/shared/jpccuy037b[/url]
【Others】
OUTLINE
Why Different Metrology at the Nanoscale
Why Properties Change
Examples of New Metrology Needs
NNI Grand Challenge
NNI Workshop Results on Nanometrology
NIST Examples
[[i] 本帖最后由 wzh12020915 于 2007-8-12 21:11 编辑 [/i]]
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