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Title:
Applied Scanning Probe Methods IX - Characterization |
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Division: Nano-related / Springer / 英文版 |
Author/Editor: Bhushan, Bharat; Fuchs, Harald; Tomitori, Masahiko (Eds.) Star:  |
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ISBN: 3540740821 |
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Introduce Date: 2008年01月06日12:36 , Release Date: 2008年01月06日21:00 |
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Introducer: weir , Rate: 0/94 |
| Format: pdf(editorial) Download |
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| Description: |
Applied Scanning Probe Methods IX
Characterization
Series: NanoScience and Technology
Volume package Applied Scanning Probe Methods
Bhushan, Bharat; Fuchs, Harald; Tomitori, Masahiko (Eds.)
2008, LX, 388 p., Hardcover
ISBN: 9783540740827 (Print) 9783540740834 (Online)
About this book
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.
After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Written for:
Professionals in industry dealing with surface analytics; scientists at universities in physical chemistry/physics, materials science, polymer science departments
Keywords:
* Material Science
* Microscopy
* Nanoscience
* Physical Chemistry
* Surface Science
http://www.springer.com/west/hom ... m/978-3-540-74082-7
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